Advances in Imaging and Electron Physics 170
Peter W. Hawkes (Eds.)
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Key features:
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Key features:
* Contributions from leading authorities * Informs and updates on all the latest developments in the field
Έτος:
2012
Έκδοση:
1
Εκδότης:
Academic Press
Γλώσσα:
english
Σελίδες:
1
ISBN 10:
0123943965
ISBN 13:
9780123943965
Σειρές:
Advances in Imaging and Electron Physics 170
Αρχείο:
PDF, 18.91 MB
IPFS:
,
english, 2012
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